Verisurf Celebrates 20 Years of Metrology
Verisurf Software Inc., worldwide supplier of 3D measurement solutions to manufacturers, announces 20 years of metrology software development.
Verisurf Software Inc., worldwide supplier of 3D measurement solutions to manufacturers, announces 20 years of metrology software development. In 1993, Verisurf was developed to meet the needs of aerospace wind tunnel model makers requiring verification of surface profiles. The company focused on the automation of advanced surface analysis capable of comparing 3D coordinate measuring machine data to 3D CAD models.
“When Verisurf first got started we used to probe single points and compare them one at a time, but now we scan millions of points and analyze them in seconds,” says Ernie Husted, Verisurf president and CEO. “It is hard to imagine any company still doing profile inspection the old way, but some still do,”
According to the company, Verisurf has introduced many firsts to the industry, including the first PC-based advanced surface analysis software, the first metrology software to support all digital measuring devices, the first metrology software with real-time live-build function to guide virtual assembly and tool building, the first metrology software with mobile remote display for large-volume laser tracker measurements, the first metrology software to implement model-based definition for inspection, and the first metrology software to automatically align metrology devices to CAD models.
The company has grown to provide metrology solutions available for manufacturing, including surface analysis, inspection, assembly guidance and reverse engineering. Consistent growth has enabled the company to add employees and expand into new corporate headquarters in 2012. The new facility houses software development, technical support, application engineering, sales, marketing and distribution warehouse. It also features a comprehensive metrology training center with class rooms and extensive laboratory space for developing and teaching large volume measurement processes.