Coordinate Metrology Society Holds 33rd Conference and Exhibition
The event in Utah hosted hundreds of visitors for conference sessions and new products and technologies.
The Coordinate Metrology Society (CMS) hosted its 33rd 2017 Coordinate Metrology Society Conference (CMSC) July 17-21, 2017, in Snowbird, Utah, hosting hundreds of visitors and featuring more than 20 original technical presentations. Portable metrology professionals convened for an annual transfer of knowledge from technology veterans and solution providers. Keith Bevan of the National Physical Laboratory (United Kingdom) served as Conference Chairman for 2017 and lead a dedicated team of elected and appointed volunteers to organize the event. Expert and novice metrologists and scientists from 12 countries around the world were on hand to experience talks and new technologies.
CMS members, special industry guests, and master users of portable measurement technology delivered a diverse slate of white papers and application presentations. The agenda included speakers from NASA, Triumph Aerostructures and other leaders in the field. Delegates discussed the latest developments covered in the technical presentations including a range of applications, from close-range photogrammetry in space to metrology-guided wing-join automation to point-cloud measurements on a coordinate measuring machine (CMM) artifact using a laser scanner.
During the conference, Randy Gruver, CMS Certification Chair, presented updates on the society’s career enhancement programs including the CMS Level-One and Level-Two Certification examinations and future certifications in the works.
Professor Ed Morse of UNC Charlotte, presented an update for the Precision Path Consortium's Roadmap for Large Scale Manufacturing, a collaboration of industry, CMS and UNC Charlotte.
In the CMSC Exhibition Hall, conference delegates explored new product introductions and advancements from technology providers in the portable measurement marketplace. More than 40 exhibitors featured the latest trends in close-tolerance, industrial CMMs, software, peripherals and services. During the week, the Exhibition Hall's Measurement and Education Zones featured daily learning exercises and displays, practical workshops and the CMS Quiz Show. The well-rounded conference also included evening networking events, User Group Meetings, a “5 Billion Micron Fun Run/Walk” and more.
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