A dynamic compensation technique, Renscan DC, enables CMM users to measure at higher speeds, but with accuracies that could only be achieved at low speeds. It operates within the company’s range of universal CMM controllers and can be combined with any of its scanning probes. This technique is a feature-based method that compensates for dynamic measurement errors induced when scanning at high speeds. These errors are easily derived through a process of measuring each feature on a part at two scanning speeds—one slow and one fast. The differences are then computed in the UCC controller to produce a dynamic compensation “map” for that feature. Once the dynamic map is derived, all subsequent parts with the same features can be measured at high speed.
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Mectron’s Qualifier (Q-5000) inspection system uses its radial fire array for dimensional inspection of a variety of parts.