XRF Analyzers Quickly Identify Grades

New Product Announcements From: 10/29/2007 Modern Machine Shop

Designed for handheld X-ray flourescence (XRF) alloy analysis, the Niton XL3 series XRF analyzers can identify grades in less than 2 seconds. Manufacturer Thermo Fisher Scientific says this is as much as five times faster than its previous generation of XRF analyzers, increasing sample throughput and productivity. The company says the device is useful for applications such as scrap recycling, positive material identification (PMI) and metal fabrication and manufacturing. 

 

The instrument features a 50-Kv, 2-W X-ray tube with multiple, multi-layer primary filters to improve excitation for elements ranging from chlorine to transuranic elements. It is equipped with 80 MHz, real-time digital-signal processing and dual embedded processors for computation, data storage, communication and other functions.

 

Additionally, the unit can be configured for small-spot sample analysis, which allows users to switch between full-area analysis for large samples and a 3-mm spot to analyze small sample areas. Its integrated VIP tilting touchscreen display enables users to view sample results in any position and in virtually all lighting conditions, the company says. The device also includes the company’s Niton Data Transfer (NDT) software, a suite of data-management utilities that allows users to produce certificates and reports and monitor or operate the instrument remotely from a PC or PDA.

Marposs - Metrology equipment for improving productivity and reducing cost in manufacturing.
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