X-Ray Inspection System Features Real-Time Data Collection
Available from Scienscope International, the ViewX is a high-resolution, x-ray inspection system designed for inspection of BGA, CSP, flip-chip semiconductors and multi-layer board registration. This pamphlet provides an overview of system specifications and notable features, which include real-time defect detectio
Available from Scienscope International, the ViewX is a high-resolution, x-ray inspection system designed for inspection of BGA, CSP, flip-chip semiconductors and multi-layer board registration. This pamphlet provides an overview of system specifications and notable features, which include real-time defect detection and data collection, an intuitive software interface and an ergonomic cabinet design.
Related Content
-
Parts and Programs: Setup for Success
Tips for program and work setups that can simplify adjustments and troubleshooting.
-
Ballbar Testing Benefits Low-Volume Manufacturing
Thanks to ballbar testing with a Renishaw QC20-W, the Autodesk Technology Centers now have more confidence in their machine tools.
-
How to Choose the Right Cut Off When Measuring Roughness
Measurement results for surface finishing parameters can vary depending on the filter parameter (Lc), also known as the cutoff.