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8/11/2008

X-Ray Inspection System Features Real-Time Data Collection

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Available from Scienscope International, the ViewX is a high-resolution, x-ray inspection system designed for inspection of BGA, CSP, flip-chip semiconductors and multi-layer board registration. This pamphlet provides an overview of system specifications and notable features, which include real-time defect detectio

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Available from Scienscope International, the ViewX is a high-resolution, x-ray inspection system designed for inspection of BGA, CSP, flip-chip semiconductors and multi-layer board registration. This pamphlet provides an overview of system specifications and notable features, which include real-time defect detection and data collection, an intuitive software interface and an ergonomic cabinet design. 

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