In-line/near-line measurement provides the potential for fast, flexible, efficient inspection that increases throughput without compromising quality. Embedded measurement however carries unique challenges and requires a special mix of capabilities to ensure optimal results. In this webinar, our measurement experts detail the realities of in-line/near-line measurement and the benefits that can be experience in its proper use.
Primary Topics:
• Key considerations associated with in-line measurement, including: space limitations along the line, necessity for 24/7 uptime, manufacturing floor temperature variances, debris and irritant considerations, and maintenance concerns
• Technologies and procedures to mitigate these challenges
• Process, logic, and productivity benefits of implementing in-line/near-line inspection systems
Presenter:
Michael Creney
VP, Product Management; Mitutoyo America Corporation
Michael brings nearly 40 years of quality measurement industry experience, with extensive knowledge of systems and software related to in-line/near-line measurement. His focus on future product development has seen him at the cutting edge of metrology innovation and make him a true expert in the field of precision measurement.