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11/2/2012

High-Resolution Microscope Provides Large Depth of Field

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Nikon Metrology offers the NeoScope II, a high-resolution scanning electron microscope (SEM) that produces images with a large depth of field at magnifications.

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Nikon Metrology offers the NeoScope II, a high-resolution scanning electron microscope (SEM) that produces images with a large depth of field at magnifications ranging from 10 to 60,000 times. It offers high- and low-vacuum operation, three selectable accelerating voltages, secondary electron and back-scattered electron imaging. The microscope accommodates samples as large as 70 mm in diameter and 50 mm thick. Both conductive and non-conductive samples can be examined without any special sample preparation, the company says. Optional EDS is available for elemental analysis. It can also be equipped with an energy-dispersive X-ray spectrometer and tilt/rotation motor drive specimen holder.
 
The SEM features a touchscreen interface with automatic functions such as auto focus, auto stigmator and auto contrast/brightness, as well as pre-stored recipe files. Auto gun alignment, or filament centering, is also provided. The microscope is capable of dual-frame imaging to facilitate comparison of live and retrieved images.
 

The base unit measures 330 × 490 × 430 mm and weighs 50 kg. It uses single-phase 100- to 240-V, 50-/60-Hz, or 700- to 960-V power. 

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