6/24/2019

LK Meterology's Altera CMM Offers Affordable Multi-Sensor Inspection Capability

Originally titled 'CMM Offers Affordable Multi-Sensor Inspection Capability'
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Westec 2019: LK Metrology will display its Altera C 10.7.5 CMM equipped with a Renishaw PH10M probe.

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LK Metrology will display its Altera C 10.7.5 CMM equipped with a Renishaw PH10M probe. The Altera C is supplied with Camio 8.5 programming, analysis and reporting software and a Renishaw articulating head and touch trigger probe that can be replaced with a variety of sensors, including Nikon laser scanners. The machine is said to lower the price of entry to CMM multi-sensor inspection technology.

The Camio software enables users to focus on accelerating lead times and improving product quality, the company says. Regardless of whether inspecting stamped, molded or machined parts, Camio 8.5 is designed to drive accurate and efficient inspection programs for geometric features along with full surface analysis with part-to-CAD comparisons. The software is interoperable across various CMM platforms.

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