Metrology System Features White Light Interferometry

The company adds the MarSurf WS 1 to its offerings in the field of optical surface metrology. Using white light interferometry in a compact design, the system provides vertical resolution of 0.004 microinch (0.1 nm) and 3D measurement in seconds, the company says. With the MarSurf XT 20 topographical evaluation software, the system can be configured to work both in the lab and on the shop floor. The white light optical sensor is designed to enable rapid, high-precision recording of surface topography on a wide range of materials. Using white light and a CCD camera, the system can collect height information through the camera's field of view. The camera simultaneously images both the test surface area and a high-precision reference surface built into the objective lens.

Related Suppliers

Editor Pick

Distributor Takes AIMS' CMM Tech on the Road

Able Machine Tool Sales’ Mobile Metrology Office, a truck and trailer loaded with inspection equipment from AIMS and Renishaw, will bring CMM technology to customers’ doorsteps.