Polytec's Micro-View 3D Profilers Measure Surfaces of Various Materials
IMTS Spark: Polytec has added the Micro-View and Micro-View+ to its TopMap family of 3D optical profilers, designed to measure roughness, texture, waviness, step heights and other surface parameters.
Polytec has added the Micro-View and Micro-View+ to its TopMap family of 3D optical profilers, designed to measure roughness, texture, waviness, step heights and other surface parameters. The non-contact devices use white light interferometry to measure rough, smooth, reflective, dull and transparent surfaces on a variety of materials, including metals, plastics, ceramic, fabrics, optics and more. In addition to providing numerical output (Ra, Sa, Sq), the 3D profilers can create visually intuitive plots that can be used to quickly diagnose manufacturing issues and manage process bottlenecks effectively, the company says.
Polytec’s Environmental Compensation Technology (ECT), in addition to advanced features that help with automating part focus, results logging and ease of use features make the devices ideal for lab settings or shopfloor environments.
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