Renishaw RFP Probe Adds to Revo Measurement System Flexibility
IMTS Spark: Renishaw’s RFP probe adds non-contact structured light inspection to the multi-sensor capability of the Revo system.
Renishaw’s RFP probe adds non-contact structured light inspection to the multi-sensor capability of the Revo system. The product range now includes five different probe families for five-axis motion and infinite positioning. All probes can be changed automatically and include tactile scanning, touch-trigger, surface finish, non-contact structured light and vision probes. They are all used within a common coordinate reference frame to enable measuring multiple features on one coordinate measuring machine (CMM) platform.
The RFP projects a fringe pattern onto the part surface, and the probe’s camera captures the variation in fringe pattern to build a point cloud of 3D surface data. The data cloud is then evaluated by the 3D metrology software to deliver the inspection results. According to the company, non-contact structured light inspection offers advantages compared to traditional tactile probing in applications involving freeform surfaces and complex geometry. Examples include additively manufactured parts, aerospace blades and blisks, automotive cylinder head combustion chambers, and delicate surfaces not suited to tactile measurement.
The RFP fringe probe does not require reference markers because the Revo system automatically stitches together data from different areas. Coating the part in a matte substance is also unnecessary thanks to the automatic exposure compensation of different surface colors, textures and reflectivity.
Two new software tools are said to ease inspection planning and digitizing. The RFP inspection planner is a tool for path planning and generating DMIS part programs from CAD, while the RFP digitizer app guides users around parts without models, collecting data as part of a reverse engineering process.
The RFP probe is automatically and repeatably interchangeable with all other probe options available for the REVO system, so the data from each sensor shares a common datum reference. This flexibility means that the optimum tool can be selected to inspect a wide range of features, all on one CMM platform, which is managed by an I++ DME-compliant interface and Renishaw's Modus metrology software.
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