CAMX 2024
Inspection of printed circuit board Source: Zeiss

How to Solve Electronics Quality Challenges While Streamlining Workflows

June 12, 2024 |

Smaller and more-intricate electronics devices are driving new imaging and measurement challenges throughout the industry. Meanwhile, the need to automate tasks has never been more important.

See how combining metrology and microscopy technologies can increase efficiency and reduce costs.

The growing demand for miniaturization and high-density interconnects make it increasingly difficult to identify defects, meaning a need for inspection technology that can do traditional metrology applications and optical inspection tasks in microscopy. Printed circuit boards (PCB) and printed circuit assemblies (PCA) need advanced metrology and inspection systems to build high reliability devices that are important for new energy vehicles (NEV), aerospace, spacecraft and medical device creation.

Both metrology and microscopy technologies combine to fulfill high-end geometric dimensioning and tolerancing (GD&T) tasks along with image analysis techniques required for new product development and failure analysis inspection. This trend helps manufacturers increase efficiency while saving on service costs and space.

Agenda: 

  • Understand how trends in electronics and medical manufacturing affect quality assurance
  • Learn how microscopy inspection and metrology work together to support electronics manufacturing
  • Application experts offer inspection tips and example workflows
  • Understand savings made on service costs and space
Presenter 1

Presenter 1:

Dustin Sirny

Product Manager - Machine Vision

Dustin Sirny is a skilled product management professional and experienced leader, driving collaboration and teamwork. Most of his career has been in manufacturing, including the last nine years in the quality systems field. With a bachelor’s degree in physics, he utilizes his technical background to communicate with customers to identify new product opportunities and deliver solutions.

Presenter 2

Presenter 2:

David Widmaier

Application Engineer

David Widmaier has been working for Zeiss for almost 10 years in various countries as an application engineer. During this time, he has gained extensive knowledge of various measurement technologies in different industries. With his extensive experience, he is a seasoned trainer who has effectively managed various internal application projects.

All content on this page is provided by the presenting company.

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