Hommel-Etamic Measurement System Offers Modular Design
The W600 series features high measurement quality, free access to measuring points, rapid changeover of the probe system, automatic probe and probe arm recognition.
The Hommel-Etamic W600 series is a flexible inspection system for roughness and contour measurement in metrology labs and shopfloor production applications.
Features include high measurement quality, free access to measuring points, rapid changeover of the probe system, automatic probe and probe arm recognition, contour probe arms with RFID chips and Evovis evaluation software with extensive functions.
The new W612 measuring station features a modular probe and system software with the capability to measure The W612 has a resolution to 1 nm with TKU400 probing system. All Digiscan probe arms use a magnetically attached kinematic mounted coupling that enables quick probe system changeover with minimum retooling time due to automatic probe recognition. The Digiscan probe arms are equipped with an RFID chip for simple calibration and automatic configuration.
The system is modular in design with manual height adjustment for precise probe positioning. The modular design enables upgrades to the roughness measurement system to contour measurement. The 120-mm traverse unit will move at a speed of 20 mm/s. The unit can either be adapted to mount on existing customer granite base or can be equipped with a new one.
Measuring and evaluation Evovis software offers a standardized user interface with easy-to-understand control logic and extensive support functions for tailoring individual measurement applications.
Related Content
-
Understanding Errors In Hand-Held Measuring Instruments
Different instruments (and different operators) are prone to different errors.
-
Ballbar Testing Benefits Low-Volume Manufacturing
Thanks to ballbar testing with a Renishaw QC20-W, the Autodesk Technology Centers now have more confidence in their machine tools.
-
How to Choose the Right Cut Off When Measuring Roughness
Measurement results for surface finishing parameters can vary depending on the filter parameter (Lc), also known as the cutoff.