Nikon Metrology offers the NeoScope II, a high-resolution scanning electron microscope (SEM) that produces images with a large depth of field at magnifications ranging from 10 to 60,000 times. It offers high- and low-vacuum operation, three selectable accelerating voltages, secondary electron and back-scattered electron imaging. The microscope accommodates samples as large as 70 mm in diameter and 50 mm thick. Both conductive and non-conductive samples can be examined without any special sample preparation, the company says. Optional EDS is available for elemental analysis. It can also be equipped with an energy-dispersive X-ray spectrometer and tilt/rotation motor drive specimen holder.

 

The SEM features a touchscreen interface with automatic functions such as auto focus, auto stigmator and auto contrast/brightness, as well as pre-stored recipe files. Auto gun alignment, or filament centering, is also provided. The microscope is capable of dual-frame imaging to facilitate comparison of live and retrieved images.