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LK Metrology Surface Roughness Probe Enhances Component Inspection

LK Metrology’s Surfacers SRP high-resolution probe is designed for seamless surface analysis within CNC measuring cycles on CMMs.

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Probe measuring the surface of a part.
Source: LK Metrology

LK Metrology has introduced the Surfacers SRP, a plug-and-play probe with a resolution of one micron. This probe is designed for analyzing the surface roughness of a component as part of a CNC measuring cycle on any CMM equipped with an industry-standard probe head. The Surfacers SRP is designed to assess small, fine-scale variations and imperfections in the surface, including peaks and valleys, rather than larger-scale features like waviness or form.

The sensor removes the need for secondary surface roughness inspection, whether conducted manually with a hand-held instrument or automatically at a separate metrology station. Manufacturers can perform comprehensive inspections on a component in a single setup within a CMM environment, resulting in significant savings in time and cost. Engineered for ease of use and versatility, the equipment comes with its own downloadable application software, facilitating integration without requiring third-party software.

The Surfacers SRP mounting is compatible with change racks, enabling automated sensor changing and improved operational efficiency. User-friendly swapping between touch probes, tactile scanning probes, noncontact laser scanners and the roughness probe provides users with extended multisensor capability.

At the core of the roughness probe is a special body that accommodates three interchangeable, skidded, stainless-steel probe modules. One module evaluates flat, conical and cylindrical surfaces, another measures concave, convex and spherical surfaces, and a third is suited for inspecting grooves more than 3-mm wide by less than 10-mm deep, or steps of similar height.

During operation, the CMM positions a stylus in contact with the part, after which the machine axes remain stationary while the probe moves the stylus across the surface under investigation. Wireless communication with the CMM computer via a Bluetooth 4.0 adapter provides seamless data transfer for analysis, simplifying installation.

The skid serves as a straight-line datum that guides the stylus across a surface to maintain probe stability. The stylus travels independently of and slightly in front of the skid, with surface deviations recorded as the difference in the relative movements of the two elements in the Z-axis. This design captures even minute surface irregularities with high accuracy.

Further improving the precision of the Surfacers SRP is an integrated preload mechanism, which isolates the stylus from the CMM kinematics during operation, providing accurate and consistent results regardless of external vibration or machine movement. The force exerted by the stylus tip, which has a radius of 5 microns, avoids surface deformation. The measurable roughness range is 0.5-6.5 Ra, representing the average roughness between the profile and the mean line.

Dave Robinson, marketing manager at LK Metrology, says, “By integrating surface roughness measurement directly onto the CMM, we are providing manufacturers with a powerful tool to streamline their inspection processes, reduce costs and improve product quality. The ability to perform multiple metrology functions on a single platform eliminates the need for time-consuming transfers of components and promotes greater accuracy by maintaining part orientation between measurements.”

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