Mitutoyo Measurement Software Streamlines Inspection Process
The integration of Metlogix M3 software into the Mitutoyo Quick Image 2D vision measuring system boost the precision and efficiency of noncontact measurements.
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Mitutoyo America Corp.’s has integrated it Metlogix M3 software into the Mitutoyo Quick Image (QI) 2D vision measuring system. This latest enhancement is said to boost the precision and efficiency of noncontact measurements.
The integration of Metlogix M3 software transforms the QI system into a more robust tool for noncontact measurements. The M3 software introduces an intuitive, icon-driven interface designed for simplicity and speed.
Key features of the Metlogix M3 software with QI include:
- Pattern-Based Measurements: The M3 software provides innovative pattern-based tools that simplify the measurement process, making it easy to measure multiple points in a single action. This can reduce setup time and increase productivity.
- Advanced Video Probes: The software’s advanced video edge detection tools, such as EyeMeasure and MeasureLogic, enable fast, accurate edge and feature capture. The VTouch probe enables video-based touch probing for quick acquisition of individual points​.
- Field of View Measurement: Metlogix’s Field of View (FOV) functionality automates part measurements by simply placing multiple parts in the camera’s view. The system detects, measures and displays results without the need for operator intervention.
- SuperImage Stitching: For larger workpieces up to 400 mm, the QI system uses a 90-mm working distance to capture and stitch multiple frames into a single image with Metlogix’s SuperImage feature. This function enhances accuracy and clarity over larger areas while allowing flexible, soft fixture setups for repeated measurements​.
With the enhanced capabilities of the M3 software, the Quick Image system can support a wide range of workpiece sizes, measuring up to 400 mm with its stage stitching function. This enables manufacturers to measure larger components with precision and efficiency.
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